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1

Preparation of Site Specific Atom Probe Tips using Focused Ion Beam Technology

McGrouther, D, McKenzie, W, Saxey, D, Cairney, JM, Marceau, R, Ringer, SP, Munroe, PR

Journal:

Microscopy and Microanalysis

Year:

2006

Language:

english

File:

PDF, 388 KB

english, 2006

2

Statistical Tools for the Local Electrode Atom Probe

Moody, MP, Stephenson, LT, Ringer, SP

Journal:

Microscopy and Microanalysis

Year:

2006

Language:

english

File:

PDF, 140 KB

english, 2006

3

Atomic Resolution Grain Boundary Analysis Using Atom Probe Tomography

Felfer, PJ, Ringer, SP, Cairney, JM

Journal:

Microscopy and Microanalysis

Year:

2010

Language:

english

File:

PDF, 779 KB

english, 2010

4

Recent Advances in FIB-based Site-specific Atom Probe Specimen Preparation Techniques

Cairney, JM, McKenzie, W, Saxey, DW, Munroe, PR, Ringer, SP

Journal:

Microscopy and Microanalysis

Year:

2007

Language:

english

File:

PDF, 3.53 MB

english, 2007

5

Analysis Techniques For Nanoscale Solute Clustering In Atom Probe Tomography

Ceguerra, A, Moody, M, Stephenson, L, Ringer, SP

Journal:

Microscopy and Microanalysis

Year:

2007

Language:

english

File:

PDF, 611 KB

english, 2007

6

Tomographic Reconstruction in Atom Probe Microscopy: Past, Present. . . Future?

Gault, B, Moody, M, Marquis, EA, Geuser, F de, Geiser, BP, Larson, DJ, Kelly, TF, Ringer, SP, Smith, GDW

Journal:

Microscopy and Microanalysis

Year:

2009

Language:

english

File:

PDF, 1.03 MB

english, 2009

7

Investigation of Self-assembled Monolayer by Atom Probe Microscopy

Gault, B, Yang, W, Ratinac, KR, Zheng, R, Braet, F, Ringer, SP

Journal:

Microscopy and Microanalysis

Year:

2009

Language:

english

File:

PDF, 2.50 MB

english, 2009